发明名称 |
Cobalt silicide fabrication methods that use protective titanium layers |
摘要 |
In a cobalt silicide fabrication process, cobalt is formed on a wafer, then titanium is formed over the cobalt, and the wafer is heated to react the cobalt with the silicon. Then the titanium and the unreacted cobalt are removed. The titanium formed by ionized physical vapor deposition to achieve a good step coverage. In some embodiments, the wafer holding pedestal bias is turned off when the titanium is being deposited.
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申请公布号 |
US2003148606(A1) |
申请公布日期 |
2003.08.07 |
申请号 |
US20020056154 |
申请日期 |
2002.01.23 |
申请人 |
FORTIN VINCENT;TSAI KUEI-CHANG |
发明人 |
FORTIN VINCENT;TSAI KUEI-CHANG |
分类号 |
H01L21/285;(IPC1-7):H01L21/44;H01L21/476 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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