发明名称 Method for forming copper interconnects
摘要 Embodiments of the invention provide a method of plating a copper film on a substrate in an electrochemical plating apparatus. The method includes positioning a substrate in an electrolyte solution, applying a current between the substrate and an anode to generate a current density of between about 10 mA/cm2 and about 40 mA/cm2 on the substrate surface, rotating the, substrate at a rotational speed of between about 20 rpm and about 50 rpm, and plating a copper film having a sheet resistance of less than about 16.5x10-2 Ohms/cm2. Embodiments of the invention further provide a copper film plated onto a semiconductor substrate, wherein the film has improved electromigration and stress characteristics
申请公布号 US2003146102(A1) 申请公布日期 2003.08.07
申请号 US20030358561 申请日期 2003.02.05
申请人 APPLIED MATERIALS, INC. 发明人 RAMANATHAN SIVAKAMI;GANDIKOTA SRINIVAS;PADHI DEENESH;MCGUIRK CHRIS;DIXIT GIRISH;CHEUNG ROBIN
分类号 C25D3/38;C25D7/12;H01L21/288;H01L21/768;(IPC1-7):C25D3/38;C25D7/04 主分类号 C25D3/38
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