发明名称 INTERFERENCE MEASURING METHOD, INTERFERENCE MEASURING DEVICE, PRODUCTION METHOD FOR PROJECTION OPTICAL SYSTEM, PROJECTION OPTICAL SYSTEM, AND PROJECTION ALIGNER
摘要 <p>A measuring accuracy for interference measuring using a diffractive optical element is enhanced. An interference measuring method comprising converting a light flux to be measured emitted from a light source into an optimum wave-front shape by means of a Null element including a diffractive optical element for projecting onto an object to be inspected, allowing a light flux that has returned to the diffractive optical element after going through the object to be inspected to interfere with a reference light flux, and detecting an interference fringe produced by the interference as the characteristic data of the above object to be inspected. The measuring method involves detecting an interference fringe with a light flux, passing some area of a diffractive optical element and included in a measurement light flux, both restricted and not restricted, and acquiring the above characteristic data free from errors otherwise caused by excessive diffraction light in the above light flux based on each interference fringe thus detected under such conditions.</p>
申请公布号 WO2003064966(P1) 申请公布日期 2003.08.07
申请号 JP2003000306 申请日期 2003.01.16
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址