发明名称 PROBE STATION
摘要 The probe station (10) includes the chuck (12) that supports the electrical device (14) to be probed by the probe apparatus (16) that extends through an opening in the platen (18), an outer shield box (24) provides sufficient space for the chuck (12) to be moved laterally by positioner (22), because the chuck (12) may freely move within the outer shield box (24), a suspended member (26) electrically interconnected to a guard potential may readily position above the chuck (12).
申请公布号 WO03065443(A2) 申请公布日期 2003.08.07
申请号 WO2002US38960 申请日期 2002.12.04
申请人 CASCADE MICROTECH, INC.;NAVRATIL, PETER;FROEMKE, BRAD;STEWART, CRAIG;LORD, ANTHONY;SPENCER, JEFF;RUMBAUGH, SCOTT;FISHER, GAVIN;MC CANN, PETE;JONES, ROD 发明人 NAVRATIL, PETER;FROEMKE, BRAD;STEWART, CRAIG;LORD, ANTHONY;SPENCER, JEFF;RUMBAUGH, SCOTT;FISHER, GAVIN;MC CANN, PETE;JONES, ROD
分类号 G01R1/18;G01R31/02;G01R31/28;G01R31/311;H01L21/66 主分类号 G01R1/18
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