发明名称 Manufacturing method of partial SOI wafer, semiconductor device using the partial SOI wafer and manufacturing method thereof
摘要 A semiconductor device includes a first semiconductor region having a buried oxide layer formed therein, a second semiconductor region in which the buried oxide layer does not exist, a trench formed to such a depth as to reach at least the buried oxide layer in a boundary portion between the first and second semiconductor regions, and an isolation insulating layer buried in the trench.
申请公布号 US2003146488(A1) 申请公布日期 2003.08.07
申请号 US20030360741 申请日期 2003.02.10
申请人 NAGANO HAJIME;YAMADA TAKASHI;SATO TSUTOMU;MIZUSHIMA ICHIRO;FUJII OSAMU 发明人 NAGANO HAJIME;YAMADA TAKASHI;SATO TSUTOMU;MIZUSHIMA ICHIRO;FUJII OSAMU
分类号 H01L21/76;H01L21/762;H01L21/8234;H01L21/8242;H01L21/84;H01L27/08;H01L27/088;H01L27/10;H01L27/108;H01L27/12;(IPC1-7):H01L29/00 主分类号 H01L21/76
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