An apparatus and method for monitoring light beams comprising a reflector for passing at least partially through the beam to reflect a sample of the beam and at least one sensor arranged to receive the reflected beam sample for determining a characteristic of the beam sample. The reflector may be arranged to oscillate and the sensors may be arranged at substantially forty-five or ninety degrees to the axis of the incident beam.
申请公布号
WO03064983(A1)
申请公布日期
2003.08.07
申请号
WO2003GB00330
申请日期
2003.01.28
申请人
ADVANCED LASER SOLUTIONS LIMITED;SPARKES, MARTIN, ROY;O'NEILL, WILLIAM