发明名称 |
METHOD OF FORMING INTERCONNECTION IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming interconnection in a semiconductor device is provided to prevent a leakage current without forming a leakage current preventing layer. CONSTITUTION: A groove for interconnection is formed in an interlayer dielectric(50). An element(for example, N2) for preventing a leakage current is doped on the interlayer dielectric. A material for interconnection is stacked and the groove is filled.
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申请公布号 |
KR20030064959(A) |
申请公布日期 |
2003.08.06 |
申请号 |
KR20020005053 |
申请日期 |
2002.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, JIN GUK;RYU, JEONG SU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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