发明名称 METHOD OF FORMING INTERCONNECTION IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming interconnection in a semiconductor device is provided to prevent a leakage current without forming a leakage current preventing layer. CONSTITUTION: A groove for interconnection is formed in an interlayer dielectric(50). An element(for example, N2) for preventing a leakage current is doped on the interlayer dielectric. A material for interconnection is stacked and the groove is filled.
申请公布号 KR20030064959(A) 申请公布日期 2003.08.06
申请号 KR20020005053 申请日期 2002.01.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, JIN GUK;RYU, JEONG SU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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