发明名称 METHOD FOR FORMING AN INSULATION FILM AND SUBSTRATE PROCESSING APPARATUS THEREFORE
摘要 A radical source is movably provided in a processing vessel holding a substrate, and the location or driving energy of the radical source is set such that the film formed on the substrate has a uniform thickness. Further, a radical source is provided at a first side of the substrate and a radical flow is formed such that the radical flow flows from the first side of the substrate surface to the other side. By optimizing the condition of the radical flow, the film formed on the substrate has a uniform thickness. <IMAGE>
申请公布号 EP1333475(A1) 申请公布日期 2003.08.06
申请号 EP20010984367 申请日期 2001.07.18
申请人 TOKYO ELECTRON LIMITED 发明人 AOYAMA, SHINTARO;SHINRIKI, HIROSHI;IGETA, MASANOBU
分类号 H01L29/78;C23C16/44;C23C16/452;C23C16/455;C23C16/458;C23C16/48;C23C16/50;H01J37/32;H01L21/00;H01L21/31;H01L21/314;H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L29/78
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