发明名称 |
Ion plating method and system for forming a wiring on a semiconductor device |
摘要 |
In an ion plating system, a wafer (201) ion which a semiconductor wiring film of e.g. Cu is to be formed is held by a wafer substrate holder (3) disposed in a vacuum chamber (2); the material of the semiconductor wiring film is evaporated by an evaporation source (4) disposed in the vacuum chamber; and a high frequency electric power for generating a plasma in the vacuum chamber, making use of the substrate holder as an electrode is supplied from a high frequency power source (10). <IMAGE> |
申请公布号 |
EP1325969(A3) |
申请公布日期 |
2003.08.06 |
申请号 |
EP20020258686 |
申请日期 |
2002.12.17 |
申请人 |
SHINMAYWA INDUSTRIES, LTD.;TSUKUBA SEMI TECHNOLOGY;NISSEI ELECTRONICS, LTD. |
发明人 |
MARUNAKA, MASAO;DOI, TOSHIYA;NOSE, KOUICHI;TAKIGAWA, SHIROU;OTAKE, KIYOSHI |
分类号 |
C23C14/24;C23C14/32;C23C14/54;H01J37/32;H01L21/02;H01L21/28;H01L21/285;H01L21/3205;H01L21/768 |
主分类号 |
C23C14/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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