发明名称 Ion plating method and system for forming a wiring on a semiconductor device
摘要 In an ion plating system, a wafer (201) ion which a semiconductor wiring film of e.g. Cu is to be formed is held by a wafer substrate holder (3) disposed in a vacuum chamber (2); the material of the semiconductor wiring film is evaporated by an evaporation source (4) disposed in the vacuum chamber; and a high frequency electric power for generating a plasma in the vacuum chamber, making use of the substrate holder as an electrode is supplied from a high frequency power source (10). <IMAGE>
申请公布号 EP1325969(A3) 申请公布日期 2003.08.06
申请号 EP20020258686 申请日期 2002.12.17
申请人 SHINMAYWA INDUSTRIES, LTD.;TSUKUBA SEMI TECHNOLOGY;NISSEI ELECTRONICS, LTD. 发明人 MARUNAKA, MASAO;DOI, TOSHIYA;NOSE, KOUICHI;TAKIGAWA, SHIROU;OTAKE, KIYOSHI
分类号 C23C14/24;C23C14/32;C23C14/54;H01J37/32;H01L21/02;H01L21/28;H01L21/285;H01L21/3205;H01L21/768 主分类号 C23C14/24
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