| 摘要 |
An integrated circuit testing apparatus includes a control section 12 including a memory for storing the plurality of testing programs corresponding to the plurality of tests, and a transfer control unit for transferring the plurality of testing programs on the basis of an control command; and an IC testing section 20 including a ROM 24 in which the testing programs transferred from the transfer control means are stored, a RAM 26 in which the test results are temporarily stored, and a processing unit 22 for temporarily storing the test results in the RAM 26 whenever execution of each testing program has been completed, synthesizing all the test results when execution of all the testing programs have been completed to set a final test result for each device to be tested, and sending the final result to the automatic sorter 30.
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