| 摘要 |
A block code for correcting adjacent errors and almost-adjacent errors that occur in semiconductor memory data, with such errors possibly being caused by a neutron single event upset (NSEU). A block code includes a generator matrix that has columns in which an exclusive-or of adjacent or almost-adjacent columns provides a unique value for each of the possible combination of columns of the generator matrix. As such, a computed syndrome can be used to effectively correct for any adjacent errors and almost-adjacent errors, as well as double-adjacent errors, double-adjacent errors, and triple-almost-adjacent errors.
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