发明名称 Methods of forming field effect transistors including floating gate field effect transistors
摘要 The invention includes methods of forming field effect transistors. In one implementation, a method of forming a field effect transistor having a gate comprising a conductive metal or metal compound received over conductively doped semiconductive material includes forming transistor gate semiconductive material into a gate line over a semiconductive material channel region. The gate line includes semiconductive material sidewalls. The semiconductive material sidewalls of the gate line are oxidized. After the oxidizing, at least one of a conductive metal or metal compound is formed in electrical connection with the transistor gate semiconductive material to comprise a substantially coextensive elongated portion of a final construction of the gate line of the field effect transistor being formed.
申请公布号 US2003143814(A1) 申请公布日期 2003.07.31
申请号 US20020061739 申请日期 2002.01.31
申请人 发明人 BICKSLER ANDREW R.;SANDHU SUKESH
分类号 H01L21/28;H01L21/336;H01L29/788;(IPC1-7):H01L21/331 主分类号 H01L21/28
代理机构 代理人
主权项
地址