发明名称 ELIMINATING SUBSTRATE NOISE BY AN ELECTRICALLY ISOLATED HIGH-VOLTAGE I/O TRANSISTOR
摘要 On the surface of a semiconductor material of a first conductivity type (101a), a lateral MOS transistor (100) is described surrounded by a well (171) of the opposite electrical isolation region (102). The semiconductor region (101a) embedding this transistor has a resistivity higher than the remainder of the semiconductor material (101) and further contains a buried layer (160) of the opposite conductivity type. This layer (160) extends laterally to the wells (171), thereby electrically isolating the near-surface portion of the semiconductor region from the remainder of the semiconductor material, and enabling the MOS transistor to operate as an electrically isolated high-voltage I/O transistor for circuit noise reduction, while having low drain junction capacitance. In the first embodiment of the invention, the buried layer (171) extends vertically deeper from the surface than the electrical isolation region (102), thereby enabling a separate contact (106) to the electrically isolated near-surface portion (101a) of the semiconductor region.
申请公布号 WO03063235(A1) 申请公布日期 2003.07.31
申请号 WO2003US01412 申请日期 2003.01.16
申请人 TEXAS INSTRUMENTS INCORPORATED;SALLING, CRAIG, T.;WU, ZHIQIANG (NMI) 发明人 SALLING, CRAIG, T.;WU, ZHIQIANG (NMI)
分类号 H01L27/04;H01L21/761;H01L21/822;H01L29/78;(IPC1-7):H01L21/823;H01L21/265;H01L21/70;H01L27/02 主分类号 H01L27/04
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