发明名称 Positive photoresist composition and method of patterning resist thin film for use in inclined implantation process
摘要 A composition includes (A) an alkali-soluble resin having Mw of 1500 to 10000, (B) a quinonediazide ester of, for example, the following formula, and (C) a phenolic compound containing an acid-decomposable group. When a resin film 1 mum thick is prepared from the alkali-soluble resin (A), the resin film is completely dissolved in 2.38% by weight tetramethylammonium hydroxide aqueous solution at 23° C. within ten seconds.
申请公布号 US2003143479(A1) 申请公布日期 2003.07.31
申请号 US20020294569 申请日期 2002.11.15
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 KATANO AKIRA;NAKAGAWA YUSUKE;KONO SHINICHI;DOI KOUSUKE
分类号 G03F7/004;G03F7/022;G03F7/023;G03F7/039;G03F7/40;H01L21/027;H01L21/266;(IPC1-7):G03F7/023;G03F7/30 主分类号 G03F7/004
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