发明名称 Unterdruckspannvorrichtung mit intergrierter elektrischen Prüfungspunkten
摘要 A vacuum chuck with a conductive circuit embedded.onto it's surface wherein the chuck provides a reliable conductive path for electrical testing as well as reliable and uniform mechanical support over the entire area of a flexible panel to be tested. In one possible form, the chuck comprises an air permeable fine grain porous alumina ceramic module having a surface coated with conductive material wherein the coating is thin enough that it does not prevent air from passing through the conductive material or the ceramic module. The conductive material may also be etched or otherwise formed into a conductive pattern to facilitate testing of a panel.
申请公布号 DE10196394(T1) 申请公布日期 2003.07.31
申请号 DE2001196394T 申请日期 2001.06.21
申请人 HONEYWELL INTERNATIONAL INC., MORRISTOWN 发明人 MOLDAVSKY, BORIS;ARAYA, JAIME;MINCEMEYER, DAVID
分类号 G01R31/02;B23Q3/08;B25B11/00;G01R1/073;G01R31/28;(IPC1-7):B25B11/00;G01R1/04 主分类号 G01R31/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利