发明名称 Analytical mesh preparation apparatus, analytical mesh preparation method, and analytical mesh preparation program
摘要 An analytical mesh preparation apparatus, an analytical mesh preparation method and an analytical mesh preparation program are provided which are capable of preparing a mesh in such a manner as to improve calculation accuracy and shorten the calculation time as well. Upon preparation of an analytical mesh by arranging grid lines in an analytical area to analyze prescribed physical quantities for an object composed of a plurality of parts, grid lines are first arranged at corners of the parts, and the intervals between adjacent ones of the grid lines are calculated. Based on the calculation result, the grid lines to be removed are determined, as a result of which the grid lines thus determined are removed. The shapes or sizes of the parts are changed in accordance with the removal of the grid lines.
申请公布号 US2003144812(A1) 申请公布日期 2003.07.31
申请号 US20020322597 申请日期 2002.12.19
申请人 FUJITSU LIMITED 发明人 SHIMIZU KOICHI;UEDA AKIRA;AOKI KENICHIRO
分类号 G06F17/50;G06T17/20;(IPC1-7):G06F15/00 主分类号 G06F17/50
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