发明名称 BATCH-TYPE PLASMA ETCHING APPARATUS
摘要 PURPOSE: A batch-type plasma etching apparatus is provided to obtain the same etching condition regardless of the position of a wafer set in a chamber by rotating a cathode so that the wafer is exposed to a uniform etching condition. CONSTITUTION: The chamber(1) has a predetermined volume in which plasma is formed, functioning as an anode. The cathode(3) has multi faces in which a plurality of wafers(W) are simultaneously disposed, installed inside the chamber. A rotation unit(10) rotates the cathode, installed under the chamber to be connected to the cathode.
申请公布号 KR20030064043(A) 申请公布日期 2003.07.31
申请号 KR20020004461 申请日期 2002.01.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, U SEOK
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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