| 摘要 |
<P>PROBLEM TO BE SOLVED: To execute a test for a semiconductor device stably regardless of operation and use conditions such as a source voltage and an ambient temperature as well as the manufacturing variation of characteristics, and improve design efficiency for peripherals of the semiconductor device. <P>SOLUTION: The semiconductor device comprising a signal processing circuit 103 which processes an input data signal Din in accordance with an operation clock, is provided with a monitor signal output circuit 102 which generates a monitor signal Dmon varying in synchronization with an external clock signal Ck, and a delay time adjustment circuit 110a which adjusts the phase of the external clock signal Ck based on a phase difference d3 between the external clock signal Ck and the monitor signal Dmon, and outputs a phase adjustment clock signal Ckadj. The phase adjustment clock signal Ckadj is supplied to the signal processing circuit 103 as its operation clock. <P>COPYRIGHT: (C)2003,JPO |
