发明名称 Gas compositions for cleaning the interiors of reactors as well as for etching films of silicon- containing compounds
摘要 This invention relates to gas compositions comprising fluorine-containing nitrogen compounds, which compositions are useful for cleaning the interior of reactors, such as those of CVD (chemical vapor deposition) equipment and also for etching films of silicon-containing compounds. Advantageously, the gas compositions are environmentally friendly and have little or no tendency to generate an effluent gas stream containing noxious ingredients, such as CF4, NF3 and the like. There are provided: a gas composition for cleaning the interior of film deposition chambers contaminated with silicic deposition, which comprises F3NO or combinations of F3NO with O2 and/or inert gas(es) or which comprises FNO or a combination of FNO with O2 and/or inert gas(es); and also a similar gas composition for etching films of silicon-containing compounds, e.g. films of semiconductive materials.
申请公布号 US2003143846(A1) 申请公布日期 2003.07.31
申请号 US20020312397 申请日期 2002.12.27
申请人 SEKIYA AKIRA;FUKAE KATSUYA;MITSUI YUKI;TOMIZAWA GINJIRO 发明人 SEKIYA AKIRA;FUKAE KATSUYA;MITSUI YUKI;TOMIZAWA GINJIRO
分类号 B08B7/00;C09K13/00;C23C16/44;H01L21/205;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/461 主分类号 B08B7/00
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