发明名称 Aberration and corneal topography measurement
摘要 A method and apparatus for measuring with a single device both the aberrations introduced by an eye and the topography of the cornea of the eye. The method includes determining aberrations within a wavefront created by reflecting a beam off the retina of an eye, determining the corneal topography of the eye from a pattern reflected by the cornea, and directing the beam, wavefront, and reflected pattern using a combiner/separator. The apparatus includes a source for generating the beam for producing the wavefront exiting the eye and a first imaging device for receiving the wavefront to determine aberrations, a projector for projecting the pattern onto the cornea for reflection by the cornea and a second imaging device for receiving the reflected pattern to determine corneal topography, and a combiner/separator for directing the beam, wavefront, and reflected pattern.
申请公布号 US2003142271(A1) 申请公布日期 2003.07.31
申请号 US20020058739 申请日期 2002.01.30
申请人 ROSS DENWOOD F.;JONE LARRY G. 发明人 ROSS DENWOOD F.;JONE LARRY G.
分类号 A61B3/103;A61B3/107;(IPC1-7):A61B3/10 主分类号 A61B3/103
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