发明名称 Built-in test signal attenuation circuit
摘要 A test signal attenuation circuit built into a signal transmitter for modifying the energy content of the transmitter output signal includes means for generating an attenuated, degraded, chopped signal for purposes of testing the performance of a link under degraded conditions.
申请公布号 US2003145267(A1) 申请公布日期 2003.07.31
申请号 US20020061517 申请日期 2002.01.31
申请人 THE BOEING COMPANY 发明人 HARRES DANIEL N.
分类号 H03M5/06;H04L1/24;(IPC1-7):H03M13/00;G01R31/28 主分类号 H03M5/06
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