发明名称 ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To make a trench being filled easily with an isolation insulating material by etching in STI process. SOLUTION: The etching method for making a trench 210 isolating an element being formed on a silicon substrate electrically by introducing a processing gas into a gastight processing chamber and subjecting silicon of the silicon substrate to plasma processing comprises a first step for introducing a mixture gas containing at least HBr and N<SB>2</SB>as the processing gas and rounding the upper side part of the sidewall of the trench by plasma processing, a second step for making a trench in the silicon of the silicon substrate by plasma processing, and a third step for introducing a mixture gas containing at least HBr and Cl<SB>2</SB>as the processing gas and rounding the bottom part of the trench by plasma processing. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003218093(A) 申请公布日期 2003.07.31
申请号 JP20020012206 申请日期 2002.01.21
申请人 TOKYO ELECTRON LTD 发明人 IIJIMA ETSUO;KO AKITERU
分类号 H01L21/3065;H01L21/76;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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