发明名称 FET amplifier with temperature-compensating circuit
摘要 A FET amplifier which minimizes the worsening of the distortion-susceptibility due to variations in the ambient temperature of operation is to be provided. An LDMOS FET 1, whose source terminal is grounded and to which are applied a gate voltage Vgs from a gate bias terminal 3 via a temperature-compensating circuit 2 and a choke coil and a drain voltage Vds from a drain bias terminal 4 via a choke coil operates as a source-grounded type amplifier. In the temperature compensating circuit 2, the resistances of fixed resistance elements 21 and 22 connected in parallel are set to be the same or have the same number of digits, and those of thermosensitive resistance elements (thermistors) 23 and 24 are set to be a combination of a value greater by one digit and a value smaller by one digit than that of the fixed resistance element 21 or the fixed resistance element 22 at the standard level (+25° C.) in the ambient temperature range of operation.
申请公布号 US2003141931(A1) 申请公布日期 2003.07.31
申请号 US20030350136 申请日期 2003.01.24
申请人 NEC CORPORATION 发明人 AMANO SHIGERU
分类号 H03F1/30;H03F3/193;(IPC1-7):H03F3/16 主分类号 H03F1/30
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