Testing of planar test-pieces to determine mechanical, thermal and electrical properties, whereby a single test apparatus can be used for determination of all said properties, resulting in significant time savings

摘要

The device for measuring the layer properties of a planar test-piece (3), whereby the test-piece can have a constant force or a force progression applied to it, via support (1a, 1b) and sensor plates (2a, 2b). In addition a temperature sensor is provided and electrodes for assessment of the sample thermal and electrical properties. An Independent claim is included for a corresponding test method.