发明名称 APPARATUS FOR INSPECTING LEADFRAME
摘要 PURPOSE: An apparatus for inspecting a leadframe is provided to more rapidly inspect the leadframe by inspecting two leadframes at a time, and to eliminate the necessity of transferring a camera frequently even in a case of a matrix-type leadframe by transferring a camera lens part in an X-Y direction. CONSTITUTION: A fixing frame(10) is positioned at a side part of a transfer rail. The first and second guide rails(20,22) extending in a direction parallel with the transfer rail are formed in a coaxial line of the fixing frame. The first and second transfer frames(12,14) are supported by each guide rail, capable of sliding, horizontally extending in a direction perpendicular to the transfer rail over a leadframe transfer rail. The third and fourth guide rails(36,38) are formed along the extension direction of the first and second transfer frames. The first and second transfer holders(24,26) are capable of sliding along the third and fourth guide rails, positioned right over a leadframe transfer path. A cylindrical camera lens part takes a picture of the quality state of the leadframe right over the leadframe, supported by each transfer holder.
申请公布号 KR20030064018(A) 申请公布日期 2003.07.31
申请号 KR20020004422 申请日期 2002.01.25
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 CHO, HAN SEOK;JI, JE YEON;WOO, SEOK HA
分类号 H01L23/495;(IPC1-7):H01L23/495 主分类号 H01L23/495
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