| 摘要 |
PROBLEM TO BE SOLVED: To separately and easily test each semiconductor component of an SBM (System Block Module) composed by integrating semiconductor components of different kinds into a package, while suppressing sharp increase of the number of its input and output pins. SOLUTION: Between a memory controller circuit 11 mounted on a first circuit board layer 12 and a memory element 31 mounted on a third circuit board layer 32 for example, an input changeover circuit 21 mounted on a second circuit board layer 22 is arranged as an interface for the memory element 31. When a test is made, a test signal from an external LSI tester is directly inputted into the memory element 31 by a control signal for the input changeover circuit 21 from the outside. COPYRIGHT: (C)2003,JPO
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