发明名称 WAVELENGTH SCATTERING FLUORESCENT X-RAY ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide a wavelength scattering fluorescent X-ray analyzer that can be shortened in evacuating time required for starting measurement while the size of the analyzer is reduced. SOLUTION: At the time of exchanging samples, a spectroscopic chamber 7 and an X-ray irradiating chamber 5 are set to measurement starting vacuums by switching stop valves 23 and 24 after a sample chamber 2 is set to a measurement starting vacuum by means of a single vacuum pump 18 in a state where the shutter 15 between the sample chamber 2 and X-ray irradiating chamber 5 is closed. Thereafter, the shutter 15 is opened. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003215073(A) 申请公布日期 2003.07.30
申请号 JP20020018298 申请日期 2002.01.28
申请人 RIGAKU INDUSTRIAL CO 发明人 KIMOTO KATSUMI;SAKO YUKIO
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
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