| 摘要 |
PROBLEM TO BE SOLVED: To enable testing by pin-multiplex function by applying the operation of a logic circuit for example to the test, and effectively evading decrease of the number of measurable channels. SOLUTION: Processing is performed by providing two systems of test waveform generation means 25A, 25B, 29, and two systems of response waveform determination means 30A, 30B, 31A, 31B with each test circuit 23A. COPYRIGHT: (C)2003,JPO
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