发明名称 REFRACTIVE INDEX MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a device capable of measuring a refractive index through easy adjustment and with high precision by eliminating a lens system for focusing which was previously needed and arranging only two points occupied by a prism and a charge-coupled device (CCD). SOLUTION: In the refractive index measuring device using a prism, at least an exit surface 2b of a refractive index measuring prism 2 is formed in the shape of a curved surface having an arc-shaped cross section (the curved surface is formed in such a way that a cylinder is partially cut off along the center line), where a photoelectric transfer element such as a CCD 3 is arranged in its focus point. Almost all light beams, which enter an interface between the prism and a sample (an object to be measured) at an angle larger than a critical refraction angle ac, are reflected by the interface to reach the CCD, on which an interface between light and shade clearly corresponding to the critical refraction angle is formed. The interface is digitized by an A/D converter 5, and is then detected by a CPU 6, enabling the measurement of a refractive index of the sample. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003215035(A) 申请公布日期 2003.07.30
申请号 JP20020009518 申请日期 2002.01.18
申请人 RES:KK;TOKYO GLASS KIKAI KK 发明人 MAKINO SHIGERU
分类号 G01N21/43;(IPC1-7):G01N21/43 主分类号 G01N21/43
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