Method and device generating integrated circuit test programs

摘要

The invention relates to a process for generating programs aimed to test an integrated circuit. Such a process is characterized in that it comprises the steps of: determining the test signals to be supplied or measured at the pins of the integrated circuit during its test, determining the signals which can be provided or measured at the pins of the integrated circuit by the test instruments available during the test, and selecting sets of test instruments which can deliver or measure the test signals. <IMAGE>