发明名称 APPARATUS AND METHOD FOR INSPECTING PIN, PIN PRODUCT AND METHOD FOR MANUFACTURING PIN PRODUCT
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method for inspecting pins which inspect appearances of the pins based on an image with less distortion and a pin product inspected by the method. SOLUTION: An shooting part 20 shoots a wiring board 10 and obtains an image data. A color CCD camera is used for a camera for shooting the wiring board 10. A camera lens uses one of a telecentric optical system. An inspection part 30 inspects quality of the pins formed on the wiring board 10 based on the image data obtained by the shooting part 20. This inspection calculates areas of pin tip faces and locations of the pins, determines whether different pins are mixed based on the calculated areas and displacement of the pins based on the calculated locations, calculates hue of each pixel, detects a part whose hue is larger than a threshold, and determines that a quantity of solder is insufficient if the part with hue larger than the threshold is detected. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003215061(A) 申请公布日期 2003.07.30
申请号 JP20020012769 申请日期 2002.01.22
申请人 IBIDEN DENSHI KOGYO KK;SOFUTO WAAKU SU KK 发明人 TAKAYAMA MASARU;KIMURA HIROSHI;SHIOMI TOSHIO
分类号 G01B11/00;G01B11/28;G01N21/956;G01R31/02;(IPC1-7):G01N21/956 主分类号 G01B11/00
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