发明名称 |
Method and device for measuring a temperature in an electronic component |
摘要 |
The invention relates to a method for measuring the junction temperature in an electronic component. A periodic test signal is led via a signal path inside the component in order to obtain an internal signal. There is a frequency and/or phase relationship between the periodic test signal and a periodic external signal. A phase shift is measured between the internal signal and the external signal. The junction temperature is determined over the component region determined by the signal path as a function of the phase shift.
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申请公布号 |
US6600331(B2) |
申请公布日期 |
2003.07.29 |
申请号 |
US20020158271 |
申请日期 |
2002.05.30 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
KILIAN VOLKER;ROTH RICHARD |
分类号 |
G01K7/01;(IPC1-7):G01R31/02 |
主分类号 |
G01K7/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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