发明名称 ARTICLE INSPECTION METHOD AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce a manufacturing cost of an article by heightening work efficiency of inspection, while keeping consistency between measurement data and the article, concerning the article requiring a plurality of inspection processes. SOLUTION: In this inspection method of the article A requiring the plurality of inspection processes, data D for specifying the article A and data E for showing an inspection result in a former inspection process are printed on the article A or an object C integrated with the article A, and printed data D, E are read in a latter inspection process, and the data E for showing the inspection result in the former inspection process is compared with the data for showing the inspection result in the latter inspection process. An electrical double layer capacitor or the like requiring an overload test between the former inspection process and the latter inspection process can be inspected by the inspection method. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003207533(A) 申请公布日期 2003.07.25
申请号 JP20020002383 申请日期 2002.01.09
申请人 NEF:KK 发明人 ONO HIRONORI
分类号 G01R31/00;H01G13/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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