| 摘要 |
PROBLEM TO BE SOLVED: To provide a test method for a semiconductor device realizing a wide range, complex, and high speed test by logic having less volume. SOLUTION: A long test program can be performed by writing one test program in incorporated test logic in a plurality of times even if logic holding a test program is long. Also, in a test by the incorporated test logic, tests of a plurality of test objects (logic, SRAM, DRAM) can be performed by only switching mode switching bits in a mode bit register provided with incorporated test logic, and reduction of test logic can be performed. COPYRIGHT: (C)2003,JPO
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