| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method for precisely measuring information on an atomic moving-radius distribution function, an atomic arrangement, an electronic state, a quantum structure, a crystal structure or the like around a specific metallic atom in an amorphous substance such as an amorphous metal, a liquid metal, an ionic solution, a quasicrystal or the like and in a crystalline structure by using a synchroton radiation facility, and an apparatus for this method. <P>SOLUTION: A method in which a relationship between an accelerating voltage and a speed of electrons is calculated precisely as a ratio to a velocity of light, a method in which a stage that X-rays are diffracted by atoms in a sample is calculated precisely and a method in which a state that X-rays are generated from a bend part in an electron storage ring is calculated precisely are invented. Therefore, an electron- cluster generator by which the information on the atomic moving-radius distribution function, the atomic arrangement, the electronic state, the quantum structure, the crystal structure or the like around the specific metallic atom in the amorphous substance and in the crystalline substance can be measured precisely, the electron storage ring in which a low-electron-density bunch can go around and the X-ray diffraction apparatus are manufactured. <P>COPYRIGHT: (C)2003,JPO</p> |
