发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method obtaining a uniform and flat trench burying surface having extremely small irregularities even by using an ordinary dry etching unit. SOLUTION: A trench is formed in a main surface of a semiconductor substrate, and an insulation layer is formed on a side wall of the trench and the main surface of the semiconductor substrate. The semiconductor manufacturing method including a process for depositing a deposit so as to fill the inside of the trench formed with the insulation layer, and a process of exposing the insulation layer on the main surface of the semiconductor substrate by etching back an excess deposit formed on the insulation layer and an upper portion of the trench formed through the deposition process. A surface of the deposit deposited in the deposition process has only irregularities of 10 nm or less. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003209165(A) |
申请公布日期 |
2003.07.25 |
申请号 |
JP20020004963 |
申请日期 |
2002.01.11 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OUCHI AKIRA;ARITA KOJI;UEMOTO YASUHIRO |
分类号 |
H01L21/302;H01L21/3065;H01L21/76;H01L21/762;(IPC1-7):H01L21/762;H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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