发明名称 Multigate semiconductor device with vertical channel current and method of fabrication
摘要 The present invention is a multibit nonvolatile memory and its method of fabrication. According to the present invention a silicon channel body having a first and second channel surface is formed. A charge storage medium is formed adjacent to the first channel surface and a second charge storage medium is formed adjacent to the second channel surface. A first control gate is formed adjacent to the first charge storage medium adjacent to the first channel surface and a second control gate is formed adjacent to the second charge storage medium adjacent to the second surface. According to the second aspect of the present invention, a transistor is provided that has a source, a channel, a drain, and a plurality of gates where the channel current flows vertically between the source and drain. According to a third embodiment of the present invention, a memory element is formed using a transistor that has a read current that flows in a direction perpendicular to a substrate in or over which the transistors form. The transistor has a charge storage medium for storing its state. Multiple control gates address the transistor.
申请公布号 US2003139011(A1) 申请公布日期 2003.07.24
申请号 US20020254878 申请日期 2002.09.26
申请人 MATRIX SEMICONDUCTOR, INC. 发明人 CLEEVES JAMES M.;SUBRAMANIAN VIVEK
分类号 G11C11/56;G11C16/04;H01L21/28;H01L21/3205;H01L21/336;H01L21/8246;H01L21/8247;H01L27/115;H01L29/76;H01L29/768;H01L29/788;(IPC1-7):H01L21/336;H01L21/320 主分类号 G11C11/56
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