| 摘要 |
Method and device to detect defects (11a, 11b, 11c) in the section shape of a product (10), wherein the following steps are provided: a step of constructing and memorizing a plurality of families of functions each of which describes a correlated type of defect (11a, 11b, 11c), or combination of defects which can be found in a product (10) observed in relation to the processing performed on the product (10); a step of dimensional measuring of the shadow cast by the product (10) when it is illuminated by a beam of light; a step of constructing a graphical representation relating to the development of the dimension of the shadow for a specific dimensional sector of the product (10); and a step of comparing the graphical representation of the functions memorized to identify the function which most resembles the representation obtained by the detection in order to classify the type, and to determine the entity, of the defect (11a, 11b, 11c) present in the section of the product (10).
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