发明名称 Crystal growth method of oxide, cerium oxide, promethium oxide, multi-layered structure of oxides, manufacturing method of field effect transistor, manufacturing method of ferroelectric non-volatile memory and ferroelectric non-volatile memory
摘要 An epitaxial rare earth oxide (001)/silicon (001) structure is realized by epitaxially growing a rare earth oxide such as cerium dioxide in the (001) orientation on a (001)-oriented silicon substrate. For this purpose, the surface of the (001)-oriented Si substrate is processed into a dimer structure by 2x1, 1x2 surface reconstruction, and a rare earth oxide of a cubic system or a tetragonal system, such as CeO2 film, is epitaxially grown in the (001) orientation on the Si substrate by molecular beam epitaxy, for example. During this growth, a source material containing at least one kind of rare earth element is supplied after the supply of an oxidic gas is supplied onto the surface of the Si substrate. If necessary, annealing is conducted in vacuum after the growth.
申请公布号 US2003136331(A1) 申请公布日期 2003.07.24
申请号 US20030355876 申请日期 2003.01.30
申请人 AMI TAKAAKI;ISHIDA YUICHI;NAGASAWA NAOMI;SUZUKI MASAYUKI;MACHIDA AKIO 发明人 AMI TAKAAKI;ISHIDA YUICHI;NAGASAWA NAOMI;SUZUKI MASAYUKI;MACHIDA AKIO
分类号 C30B23/02;H01L21/02;H01L21/316;H01L29/51;H01L29/78;(IPC1-7):H01L21/00;H01L21/336;H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119;H01L21/320;H01L21/476;C30B1/00;C30B29/10 主分类号 C30B23/02
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