Test systems for semiconductor devices

摘要

A test system for an integrated circuit chip, protects a circuit board from frost during low temperature testing. The test system comprises sealing means capable of removably attaching to a second surface of the test circuit board and for sealing a portion of the second surface to isolate the portion of the second surface of the test circuit board from ambient air. In this manner, the sealing unit prevents generation of frost at the solder junction portion of the test circuit, which would otherwise lead to leakage failures during test.