发明名称 Semiconductor device and method of manufacture thereof
摘要 A method is provided for manufacturing a semiconductor device having a multilayer wiring structure in which at least one insulating film is formed with a set of conducting portions which are electrically connected to each other to have a surface area of no less than 500 mum2 and which include a wiring having a width of no more than l.0 mum. The method includes a polishing step (501) for flattening the conducting portions together with the insulating film by chemical mechanical polishing, a chemical cleaning step (502) for cleaning the flattened surface of the insulating film with a cleaning liquid, and a rising step (503) for removing the cleaning liquid using a rinsing liquid. The rinsing step is performed using water with a dissolved oxygen concentration decreased to no more than 6 ppm by weight as the rinsing liquid.
申请公布号 US2003137052(A1) 申请公布日期 2003.07.24
申请号 US20020326883 申请日期 2002.12.23
申请人 FUJITSU LIMITED 发明人 HORIUCHI HIROSHI;YAMAMOTO TAMOTSU;TAKIGAWA YUKIO;SUZUKI SHIGERU;SANTO NOBUAKI;MIYAJIMA MOTOSHU
分类号 H01L21/02;H01L21/321;H01L21/768;H01L23/532;(IPC1-7):H01L21/476;H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/02
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