发明名称 System and method for back-side contact for trench semiconductor device characterization
摘要 A method for forming a back-side contact for a vertical trench device includes grinding a back-side of a semiconductor substrate, milling a trench in the back-side of the semiconductor substrate, wherein a vertical trench fill is exposed, and depositing a conductive material, wherein the conductive material shorts the vertical trench fill to a buried plate. Grinding the back-side of the semiconductor substrate further includes grinding a dimple beneath a portion of the vertical trench device, wherein the trench is milled in the bottom portion of the dimple.
申请公布号 US2003136993(A1) 申请公布日期 2003.07.24
申请号 US20020051544 申请日期 2002.01.18
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 HUMMLER KLAUS
分类号 H01L21/768;H01L21/8242;H01L23/48;(IPC1-7):H01L21/824;H01L21/311;H01L27/108;H01L29/94 主分类号 H01L21/768
代理机构 代理人
主权项
地址