Pulse generation circuit and semiconductor tester that uses the pulse generation circuit

摘要

The present invention provides a pulse generation circuit comprising: a pulse formation circuit for generating normal and dummy pulses according to second delay value data; a data calculation circuit for calculating first delay value data being shown a timing at which the pulses is generated from the pulse formation circuit according to pattern data that has information for determining whether to generate pulses from the pulse formation circuit; a dummy pulse control circuit for controlling generation of a dummy pulse in a no-pulse-generation cycle from the pulse formation circuit according to the second delay value data obtained by detecting said no-pulse-generation cycle from said first delay value data; and a logical gate circuit for eliminating the dummy pulses generated from the pulse formation circuit, being disposed between said pulse formation circuit. solves the problem by providing the delay circuit with a dummy pulse generating means for generating dummy pulses in a cycle in which no pulse is generated usually. Thus, according to the present invention, the power consumption per unit time can be controlled fixedly.