| 摘要 |
A programmable clock generator (220), which is part of an integrated circuit (IC) (210), provides clock signals (230) and (232) to various components of the IC. The clock generator includes a PLL (322) and one or more choppers (326, 328) which provide a desired waveform to the IC for testing purposes. When used in conjunction with a tester (212, 312), the IC can be scan tested at-speed using slower and less expensive testing equipment.
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