| 摘要 |
The present disclosure describes a system and method for testing component IC chips. The system includes a management controller that has an embedded JTAG test routine operable to test one or more component IC chips associated with the management controller. The system further includes a memory associated with the management controller and the management controller is further operable to save a JTAG test routine result within the memory. More specifically, the management controller is operable to test one or more associated component IC chips using the embedded JTAG test routine during boot up of the system.
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