发明名称 Lithographic projection apparatus and device manufacturing method
摘要 A lithographic projection apparatus includes a radiation system for supplying a projection beam of radiation having a propagation direction, a support structure for supporting patterning structure, the patterning structure serving to pattern the projection beam according to a desired pattern, a substrate table for holding a substrate and a projection system for projecting the patterned beam onto a target portion of the substrate, wherein the lithographic projection apparatus further includes a sensor for measuring a movement of the projection beam perpendicular to its propagation direction and a controller to control a received dose of the projection beam on a target portion of the substrate in response to an output from the sensor.
申请公布号 US6597431(B2) 申请公布日期 2003.07.22
申请号 US20010899560 申请日期 2001.07.06
申请人 ASML NETHERLANDS B.V. 发明人 BENSCHOP JOZEF PETRUS HENRICUS;NOORDMAN OSCAR FRANSISCUS JOZEPHUS;RENKENS MICHAEL JOZEFA MATHIJS;LOOPSTRA ERIK ROELOF;BANINE VADIM YEVGENYEVICH;MOORS JOHANNES HUBERTUS JOSEPHINA;VAN DIJSSELDONK ANTONIUS JOHANNES JOSEPHUS
分类号 G01B21/00;G03F7/20;H01L21/027;(IPC1-7):G03B27/72;G03B27/42 主分类号 G01B21/00
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