发明名称 SEMICONDUCTOR WAFER PROCESSING SYSTEM HAVING IMPROVED VACUUM LINE CONNECTING STRUCTURE
摘要 PURPOSE: A semiconductor wafer processing system having an improved vacuum line connecting structure is provided to be capable of reducing the generation of leak and restraining the generation of particles by using a single type connecting part. CONSTITUTION: A semiconductor wafer processing system having improved vacuum line connecting structure is provided with a process chamber(21) for forming processing space, a vacuum gauge(25) installed at the front portion of a vacuum line(23) for measuring the degree of vacuum of the process chamber, and a single type connecting part(27). At this time, the single type connecting part includes a flange part(27a) connected to the upper surface of the process chamber for connecting the vacuum line and the process chamber, a pipe part(27b) formed at the center portion of the flange part as one piece for connecting the vacuum line. Preferably, a sealing part(29) is installed between the flange part and the process chamber.
申请公布号 KR20030061138(A) 申请公布日期 2003.07.18
申请号 KR20020001525 申请日期 2002.01.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEO, GWANG WON
分类号 H01L21/02;(IPC1-7):H01L21/02 主分类号 H01L21/02
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