发明名称 MEASURING UNIT USED IN MEASURING DEVICE UTILIZING TOTAL REFLECTION, METHOD OF MANUFACTURING MEASURING UNIT, AND MEASURING DEVICE UTILIZING TOTAL REFLECTION
摘要 PROBLEM TO BE SOLVED: To improve the measuring accuracy in a measuring device utilizing the total reflection. SOLUTION: A surface plasmon sensor comprising a measurement chip 10, a laser light source 14 generating the optical beam L for measurement, an incoming optical system 15, a cylindrical lens 16, a light detecting means 17, and a signal processing part 20 for processing the output from the light detecting means 17, further comprises a partition 5 for dividing a sample holding part 13 of the measurement chip 10 into two areas A, B, and the sample holding part 13 of the measurement chip 10 is provided with a guide part 13b for inserting the partition 5. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003202289(A) 申请公布日期 2003.07.18
申请号 JP20020079012 申请日期 2002.03.20
申请人 FUJI PHOTO FILM CO LTD 发明人 KIMURA TOSHIHITO
分类号 G01N21/03;G01N21/01;G01N21/27;(IPC1-7):G01N21/27 主分类号 G01N21/03
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