发明名称 SAMPLE DEGRADING DEVICE AND IMPURITY ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a sample degrading device suitable for analyzing and evaluating an impurity on a surface in an arbitrary specific region, of a sample and that in the sample, and to provide an impurity analyzing method of the sample using the same. SOLUTION: This sample degrading device comprises a pressure bonding member having an opening part for dropping a solution onto the surface of the sample to be degraded, and pressure bonded to a sample face to prevent the solution from flowing out, a slide member having a through-hole for inserting the pressure bonding member, and a slidable fitting groove part at its lower end part, a plate member of the disc shape, having a strip-like cut part reaching an outer peripheral end including a center and a fitting part to the slide member on its cutting part, and a table member provided with a recessed part for placing the plate member through the sample. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003202278(A) 申请公布日期 2003.07.18
申请号 JP20010402005 申请日期 2001.12.28
申请人 TOSHIBA CORP;TOSHIBA MICROELECTRONICS CORP 发明人 TAKENAKA MIYUKI;YAMADA YUJI;KOZUKA SHOJI;MATSUNAGA HIDEKI
分类号 G01N27/62;G01N1/28;G01N1/32;(IPC1-7):G01N1/28 主分类号 G01N27/62
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