发明名称 METHOD FOR DOPING SEMICONDUCTOR LAYER, METHOD FOR PRODUCING THIN FILM SEMICONDUCTOR ELEMENT AND THIN FILM SEMICONDUCTOR ELEMENT
摘要 A low concentration impurity diffusion region is formed with good controllability even in case of using a low heat resistant substrate. When doping a semiconductor layer, after forming the semiconductor layer on the substrate, the amount of the dopant ion adsorbed on a surface of the semiconductor layer is controlled by introducing hydrogen gas at the time of plasma irradiation and activating the adsorbed dopant ion in the semiconductor layer by an excimer laser.
申请公布号 KR20030061423(A) 申请公布日期 2003.07.18
申请号 KR20037007594 申请日期 2003.06.05
申请人 发明人
分类号 G02F1/136;H01L29/786;G02F1/1368;H01L21/20;H01L21/223;H01L21/225;H01L21/265;H01L21/268;H01L21/336;H01L21/77;H01L21/84 主分类号 G02F1/136
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